High-Resolution X-ray Spectroscopy Achieved with SiSeRO-CCD

The development of the fully depleted, p-channel SiSeRO-CCD represents a significant advancement in X-ray detector technology. The device achieves sub-electron noise performance and efficient charge collection in a thick, fully depleted silicon detector. The X-ray characterization demonstrates excellent energy resolution and a broad energy response, making it suitable for a wide range of X-ray spectroscopy applications. The measurements with $^{55}$Fe and $^{241}$Am sources confirm the CCD's ability to detect and resolve spectral features across a wide energy range. The consistency of charge transport and diffusion with full sensor depth interactions indicates efficient charge collection throughout the detector volume. This technology has the potential to revolutionize X-ray astronomy by enabling the detection of faint X-ray sources and the study of high-energy phenomena with unprecedented precision. Future space-based observatories equipped with these advanced CCDs will provide valuable insights into the universe.

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